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AS 3641.2-1999
[Current]Recommended practice for atomic emission spectrometric analysis, Part 2: Inductively coupled plasma excitation
Sets out recommendations for instrumentation and operating procedures in the application of the inductively coupled plasma (ICP) excitation to chemical analysis by atomic emission spectrometry.
Published: 05/12/1999
Pages: 28
Table of contents
Cited references
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Table of contents
Header
About this publication
PREFACE
1 SCOPE AND GENERAL
1.1 SCOPE
1.2 REFERENCED DOCUMENTS
1.3 DEFINITIONS
1.4 PRINCIPLE OF THE TECHNIQUE
1.5 SAFETY PRECAUTIONS
1.5.1 General
1.5.2 Ultraviolet radiation
1.5.3 Fume hoods
1.5.4 Radiofrequency leakage
2 INSTRUMENTATION
2.1 PRINCIPLE OF OPERATION
2.2 GENERAL
2.3 TORCH AND POWER SUPPLY
2.4 SAMPLE INTRODUCTION SYSTEM
2.4.1 Nebulization system
2.4.2 Other types of sample introduction
2.5 GAS CONTROL SYSTEM
2.6 OPTICAL SYSTEM
2.7 DETECTION AND MEASUREMENT SYSTEM
2.8 DATA PROCESSING AND COMPUTER CONTROL
2.9 ADDITIONAL EQUIPMENT
3 INSTRUMENT OPTIMIZATION
3.1 GENERAL
3.2 PROFILING OF A SIMULTANEOUS SPECTROMETER
3.2.1 General
3.2.2 Profiling of each spectral line
3.2.3 Routine profiling of the spectrometer
3.3 WAVELENGTH CALIBRATION OF A SEQUENTIAL SPECTROMETER
3.3.1 General
3.3.2 Profiling of a sequential spectrometer
3.4 OPTICAL ALIGNMENT OF PLASMA
3.5 PLASMA OPTIMIZATION
3.5.1 General
3.5.2 Gas control
3.6 INTERFERENCES
3.6.1 General
3.6.2 Spectral interference
3.6.3 Matrix interferences
4 INSTRUMENT PERFORMANCE TESTS
4.1 GENERAL
4.2 FREQUENCY OF TESTING
4.3 REPEATABILITY OF THE INSTRUMENT
4.4 REPEATABILITY OF THE MEASURING SYSTEM
4.5 TESTS ON MEASURING CIRCUITS
4.5.1 Dark current
4.5.2 Radiofrequency interference
4.6 BACKGROUND EQUIVALENT CONCENTRATION
4.7 LIMIT OF DETECTION
5 INSTRUMENT OPERATION
5.1 INTRODUCTION
5.1.1 General
5.1.2 Contamination and reagent purity
5.2 METHOD DEVELOPMENT
5.2.1 General
5.2.2 Instrument settings
5.2.3 Spectral interference
5.2.4 Background correction
5.2.5 Blank correction
5.2.6 Integration time
5.2.7 Pre-integration time
5.2.8 Internal standard
5.3 CALIBRATION OF SPECTROMETER
5.4 STANDARDIZATION
5.4.1 General procedure
5.4.2 Standardizing solutions
5.4.3 Standardizing the measured intensities
5.4.4 Equation for corrections (see Figure 3)
5.5 ANALYSIS PROCEDURE
5.5.1 Treatment of test sample
5.5.2 Treatment of blank test sample
5.6 ACCEPTANCE OF RESULTS
5.6.1 General
5.6.2 Acceptance of analytical values
5.6.2.1 Single determination
5.6.2.2 Replicate determinations
5.6.2.3 Acceptance of reference material result
6 ANALYTICAL QUALITY ASSURANCE
6.1 GENERAL
6.2 INSTRUMENT CALIBRATION AND STANDARDIZATION
6.3 VALIDATION OF ANALYTICAL PROCEDURE
6.3.1 Traceability of samples
6.3.2 Documentation of analytical methods
6.3.3 Monitoring of analytical performance
6.4 TREATMENT OF DATA FROM MONITORING PROCEDURE
6.5 TRACEABILITY OF RESULTS
6.6 CORRECTIVE ACTION
APPENDIX A
APPENDIX B
Cited references in this standard
ASTM E 135
Terminology relating to analytical chemistry for metals, ores and related materials
BS 5703
Guide to data analysis and quality control using cusum techniques (series)
[Current]
Recommended practice for atomic emission spectrometric analysis, Part 1: Principles and techniques
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