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AS 2563:2019

[Current]

Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision

The objective of this Standard is to describe methods of test that can be applied to wavelength dispersive X-ray fluorescence (WD-XRF) spectrometers to ensure that the spectrometers are functioning in a manner that allows precise analyses to be made.
Published: 23/01/2019
Pages: 26
Table of contents
Cited references
Content history
Table of contents
Header
About this publication
Preface
Foreword
Introduction
1 Scope
2 Frequency of testing
3 Counter tests
3.1 Counter resolution
3.1.1 General
3.1.1.1 Theoretical resolution
3.1.1.2 Scintillation counter
3.1.1.3 Practical resolution
3.1.2 Procedure
3.1.3 Assessment of results
3.1.3.1 Gas flow proportional counter
3.1.3.2 Scintillation and sealed gas counters
3.2 Conductivity of the gas flow proportional counter window
3.2.1 General
3.2.2 Procedure
3.2.2.1 Sequential spectrometers
3.2.2.2 Simultaneous spectrometers
3.2.3 Assessment of results
3.3 Pulse shift corrector
3.3.1 General
3.3.2 Procedure
4 Spectrometer tests
4.1 General
4.2 Precision
4.2.1 General
4.2.2 Calculation of counting statistical error
4.3 Test specimen
4.3.1 General
4.3.2 Sequential spectrometers
4.3.3 Simultaneous spectrometers
4.4 Instrumental conditions
4.4.1 General
4.4.2 Sequential spectrometers
4.4.3 Simultaneous spectrometers
4.5 Stability test
4.6 Specimen rotation test
4.7 Carousel reproducibility test
4.8 Mounting and loading reproducibility test
4.9 Comparison of sample holders
4.10 Comparison of carousel positions
4.11 Angular reproducibility
4.12 Collimator reproducibility (for sequential spectrometers fitted with an interchangeable collimator)
4.13 Detector changing reproducibility (for sequential spectrometers fitted with more than one detector)
4.14 Crystal changing reproducibility
4.15 Other tests
4.16 Note on glass bead curvature
5 Determination of the dead time and the maximum usable count rate of the equipment
5.1 General
5.2 Methods of determination of dead time
5.2.1 General
5.2.2 Recommended method for determining dead time
5.2.2.1 Specimens
5.2.2.2 Setting the X-ray tube high voltage
5.2.2.3 Measurements
5.2.2.4 Dead-time correction method I — Non extendable dead time
5.2.2.5 Example of measurement data and dead-time calculations
5.2.2.6 Dead-time correction method II and dead-time calculations — Extendable dead time
Annex A
Bibliography
Cited references in this standard
Content history
[Superseded]
AS 2563-1996 Rec:2016
DR AS 2563:2018

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